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American Institute of Physics, Applied Physics Letters, 23(109), p. 232103, 2016

DOI: 10.1063/1.4971366

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Local carrier recombination and associated dynamics in m-plane InGaN/GaN quantum wells probed by picosecond cathodoluminescence

This paper is available in a repository.
This paper is available in a repository.

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Abstract

We report on spatially resolved and time-resolved cathodoluminescence (CL) studies of the recombination mechanisms of InGaN/GaN quantum wells (QWs) grown by metal-organic vapour phase epitaxy on bulk m-plane Ammono GaN substrates. As a result of the 2° miscut of the GaN substrate, the sample surface exhibits step bunches, where semi-polar QWs with a higher indium concentration than the planar m-plane QWs form during the QW growth. Spatially resolved time-integrated CL maps under both continuous and pulsed excitation show a broad emission band originating from the m-plane QWs and a distinct low energy emission originating from the semi-polar QWs at the step bunches. High resolution time-resolved CL maps reveal that when the m-QWs are excited well away from the step bunches the emission from the m-plane QWs decays with a time constant of 350 ps, whereas the emission originating semi-polar QWs decays with a longer time constant of 489 ps. The time constant of the decay from the semi-polar QWs is longer due to the separation of the carrier wavefunctions caused by the electric field across the semi-polar QWs. ; Other ; This work has been funded by the EPSRC (Grant Nos. EP/J003603/1, EP/J001627/1, and EP/M011682/1) and in part by the European Research Council under the European Community's Seventh Framework Programme (FP7/2007-2013)/ERC Grants Agreement No. 279361 (MACONS).