InGaN/GaN multiple quantum well light emitting diode structures have been grown on sapphire substrates by metalorganic chemical vapor deposition. They are investigated, in this study, by high-resolution X-ray diffraction, high-resolution transmission electron microscopy, photoluminescence, and photoluminescence excitation. HR-XRD showed multiple satellite peaks up to 10th order due to the quantum well superlattice confinement effects. These indicate the high quality of layer interface structures of this sample. Excitation power-dependent photoluminescence shows that both piezoelectric field-induced quantum-confined Stark effect and band filling effect influence the luminescent properties of this sample. Temperature-dependent photoluminescence of this sample has also been studied. The peak position of the PL exhibits a monotonic red-shift and the full width at half maximum of the PL band shows a W-shaped temperature-dependent behavior with increasing temperature. From the photoluminescence excitation results, a large energy difference, so-called Stokes shift, between the band-edge absorption and emission was observed.