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American Institute of Physics, APL Materials, 1(5), p. 016101

DOI: 10.1063/1.4973558

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Electronic structure of buried LaNiO3 layers in (111)-oriented LaNiO3/LaMnO3 superlattices probed by soft x-ray ARPES

Journal article published in 2016 by F. Y. Bruno ORCID, M. Gibert, S. McKeown Walker, S. McKeown Walker, O. E. Peil ORCID, A. de la Torre, S. Riccò, Z. Wang ORCID, S. Catalano ORCID, A. Tamai ORCID, F. Bisti, V. N. Strocov, J.-M. Triscone, F. Baumberger ORCID
This paper is made freely available by the publisher.
This paper is made freely available by the publisher.

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Abstract

Taking advantage of the large electron escape depth of soft x-ray angle resolved photoemission spectroscopy, we report electronic structure measurements of (111)-oriented [LaNiO3/LaMnO3] superlattices and LaNiO3 epitaxial films. For thin films, we observe a 3D Fermi surface with an electron pocket at the Brillouin zone center and hole pockets at the zone vertices. Superlattices with thick nickelate layers present a similar electronic structure. However, as the thickness of the LaNiO3 is reduced, the superlattices become insulating. These heterostructures do not show a marked redistribution of spectral weight in momentum space but exhibit a pseudogap of ≈50 meV.