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American Institute of Physics, Review of Scientific Instruments, 11(87), p. 113702

DOI: 10.1063/1.4967235

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A Scanning Hall Probe Microscope for high resolution, large area, variable height Magnetic Field Imaging

Journal article published in 2016 by Gorky Shaw ORCID, R. B. G. Kramer ORCID, N. M. Dempsey, K. Hasselbach
This paper is available in a repository.
This paper is available in a repository.

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Abstract

We present a Scanning Hall Probe Microscope operating in ambient conditions. One of the unique features of this microscope is the use of the same stepper motors for both sample positioning as well as scanning, which makes it possible to have a large scan range (few mm) in x and y directions, with a scan resolution of 0.1 µm. Protocols have been implemented to enable scanning at different heights from the sample surface. The z range is 35 mm. Microstructured Hall probes of size 1-5 µm have been developed. A minimum probe-sample distance