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American Institute of Physics, Applied Physics Letters, 2(78), p. 219

DOI: 10.1063/1.1338499

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X-Ray Analysis of Spontaneous Lateral Modulation in (InAs)n/(AlAs)m Short-Period Superlattices

This paper is available in a repository.
This paper is available in a repository.

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Abstract

The lateral composition modulation in ( InAs )n/( AlAs )m short-period superlattices was studied by means of synchrotron x-ray diffraction. By choosing specific diffraction vectors having a large component closely parallel to the modulation direction, we are able to observe a number of lateral satellite peaks around the zero-order short-period superlattice peak. A model, incorporating both composition and strain, is used to simulate the intensities of these satellites. Our results provide a quantitative fit and permit the evaluation of the composition amplitude. © 2001 American Institute of Physics.