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American Institute of Physics, Journal of Vacuum Science and Technology A, 3(34), p. 030801

DOI: 10.1116/1.4946046

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Recent applications of hard x-ray photoelectron spectroscopy

Journal article published in 2016 by Conan Weiland, Abdul K. Rumaiz ORCID, Piero Pianetta, Joseph C. Woicik
This paper was not found in any repository, but could be made available legally by the author.
This paper was not found in any repository, but could be made available legally by the author.

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Abstract

Recent applications of hard x-ray photoelectron spectroscopy (HAXPES) demonstrate its many capabilities in addition to several of its limitations. Examples are given, including measurement of buried interfaces and materials under in situ or in operando conditions, as well as measurements under x-ray standing-wave and resonant excitation. Physical considerations that differentiate HAXPES from photoemission measurements utilizing soft x-ray and ultraviolet photon sources are also presented.