Published in
Elsevier, Solid-State Electronics, (128), p. 31-36
DOI: 10.1016/j.sse.2016.10.020
2016 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS)
DOI: 10.1109/ulis.2016.7440060
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Drain current local variability from linear to saturation region in 28nm bulk NMOSFETs
Journal article published in 2016 by
T. A. Karatsori,
C. G. Theodorou 
,
S. Haendler,
C. A. Dimitriadis,
G. Ghibaudo
,
S. Haendler,
C. A. Dimitriadis,
G. Ghibaudo
This paper is available in a repository.
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