Published in
American Institute of Physics, AIP Conference Proceedings
DOI: 10.1063/1.2036857
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On the high-frequency noise figures of merit and microscopic channel noise sources in fabricated 90 nm PD SOI MOSFETs
Proceedings article published in 2005 by
Mj Martin,
G. Pailloncy,
G. Dambrine,
Raúl Rengel 
,
F. Danneville,
T. Gonzalez,
J. Mateos,
D. Pardo
,
F. Danneville,
T. Gonzalez,
J. Mateos,
D. Pardo
This paper was not found in any repository, but could be made available legally by the author.
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