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American Scientific Publishers, Journal of Nanoscience and Nanotechnology, 8(13), p. 5800-5806

DOI: 10.1166/jnn.2013.6795

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Investigation the Electroplating Behavior of Self Formed CuMn Barrier

Journal article published in 2013 by Chia-Yang Wu, Wen-Hsi Lee, Shih-Chieh Chang, Ying-Lang Wang
Distributing this paper is prohibited by the publisher
Distributing this paper is prohibited by the publisher

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