Published in
Elsevier, Solid-State Electronics, 2(43), p. 285-295
DOI: 10.1016/s0038-1101(98)00253-6
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Generation-recombination noise modelling in semiconductor devices through population or approximate equivalent current density fluctuations
Journal article published in 1999 by
Fabrizio Bonani,
Giovanni Ghione 
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Abstract
SOLID STATE ELECTRONICS