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IOP Publishing, Nanotechnology, 15(27), p. 155203, 2016

DOI: 10.1088/0957-4484/27/15/155203

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Systematic layer-by-layer characterization of multilayers for three-dimensional data storage and logic

Journal article published in 2016 by Dorothée Petit, Reinoud Lavrijsen, JiHyun Lee, Rhodri Mansell ORCID, Amalio Fernández-Pacheco, Russell P. Cowburn
This paper is made freely available by the publisher.
This paper is made freely available by the publisher.

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