World Scientific Publishing, Surface Review and Letters, 04n05(11), p. 463-467
DOI: 10.1142/s0218625x04006396
Full text: Unavailable
We have measured the morphological grain sizes of nanostructured platinum and gold thin films. In previous works their electrical resistivities have been measured and a theoretical approach was proposed to explain the resistivity experimental data. It will be shown that within the framework of our theoretical approach, the morphological grain sizes play an essential role in the electrical resistivity of these metallic thin films.