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World Scientific Publishing, Surface Review and Letters, 04(10), p. 571-575

DOI: 10.1142/s0218625x03005323

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Nanostructured Gold Thin Films: Young Modulus Measurement

Journal article published in 2003 by M. C. Salvadori ORCID, A. R. Vaz, L. L. Melo, M. Cattani
This paper was not found in any repository, but could be made available legally by the author.
This paper was not found in any repository, but could be made available legally by the author.

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Abstract

We have uniformly coated the cantilever of an atomic force microscope (AFM) with gold thin films. These films are nanostructured with thickness going from 19 to 62 nm. The resonance frequencies of this cantilever have been measured, before and after the Au coatings. Taking into account these frequencies and the vibrating beam theory, we determined the Young modulus of the Au films, obtaining E2 = 69.1 ± 2.6 GPa , i.e. about 12% lower than the respective bulk elastic modulus.