Published in
World Scientific Publishing, Surface Review and Letters, 01(10), p. 1-5
DOI: 10.1142/s0218625x03004561
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Measurement of Critical Exponents of Platinum Thin Films
Journal article published in 2003 by
M. C. Salvadori 
,
L. L. Melo,
M. Cattani,
O. R. Monteiro,
I. G. Brown
,
L. L. Melo,
M. Cattani,
O. R. Monteiro,
I. G. Brown
This paper was not found in any repository, but could be made available legally by the author.
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Abstract
We have fabricated platinum thin films by metal plasma ion deposition on silicon substrates. The roughness of these films has been measured by a scanning tunneling microscope (STM) and we have determined the growth dynamics critical exponents.