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MAIK Nauka/Interperiodica, Technical Physics Letters, 10(33), p. 889-892
DOI: 10.1134/s1063785007100240
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Nanolocalized charge writing in thin SiO2 layers with embedded silicon nanocrystals under an atomic force microscope probe
Journal article published in 2007 by
M. S. Dunaevskii,
A. N. Titkov,
S. Y.-U. Larkin,
A. B. Speshilova,
S. E. Aleksandrov,
C. Bonafos,
A. Claverie,
R. Laiho
This paper was not found in any repository, but could be made available legally by the author.
Full text: Unavailable
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