Published in
IOP Publishing, Journal of Neural Engineering, 3(10), p. 031002, 2013
DOI: 10.1088/1741-2560/10/3/031002
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Corrosion of silicon integrated circuits and lifetime predictions in implantable electronic devices
Journal article published in 2013 by
A. Vanhoestenberghe 
,
N. Donaldson
,
N. Donaldson
This paper is made freely available by the publisher.
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