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IOP Publishing, Nanotechnology, 47(24), p. 475702

DOI: 10.1088/0957-4484/24/47/475702

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Open loop Kelvin probe force microscopy with single and multi-frequency excitation

Journal article published in 2013 by L. Collins ORCID, J. I. Kilpatrick, S. A. L. Weber, A. Tselev ORCID, I. V. Vlassiouk, I. N. Ivanov ORCID, S. Jesse, S. V. Kalinin ORCID, B. J. Rodriguez
This paper is available in a repository.
This paper is available in a repository.

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