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IOP Publishing, Journal of Physics D: Applied Physics, 38(45), p. 385304, 2012

DOI: 10.1088/0022-3727/45/38/385304

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Growth of atomically thin hexagonal boron nitride films by diffusion through a metal film and precipitation

Journal article published in 2012 by Satoru Suzuki, Roger Molto Pallares ORCID, Hiroki Hibino ORCID
This paper is made freely available by the publisher.
This paper is made freely available by the publisher.

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Abstract

Abstract Atomically thin hexagonal boron nitride films were grown on both the top and bottom surfaces of a polycrystalline Co or Ni film by annealing a Co (Ni)/amorphous boron nitride/SiO2 structure in vacuum. This method of growing hexagonal boron nitride is much simpler than other methods, such as thermal chemical vapour deposition. B and N atoms diffuse through the metal film, although N is almost completely insoluble in both Co and Ni, and precipitation occurs at the topmost surface. The mass transport is considered to be caused by grain boundary diffusion.