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American Chemical Society, Industrial & Engineering Chemistry Research, 9(30), p. 2105-2113, 1991

DOI: 10.1021/ie00057a008

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Temperature-programmed reduction and x-ray photoelectron spectroscopy of copper oxide on alumina following exposure to sulfur dioxide and oxygen

This paper was not found in any repository; the policy of its publisher is unknown or unclear.
This paper was not found in any repository; the policy of its publisher is unknown or unclear.

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