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Cambridge University Press, Microscopy and Microanalysis, S2(18), p. 1386-1387, 2012

DOI: 10.1017/s1431927612008781

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Dispersion of Ni particles on SiO2 by an improved incipient wetness method and full characterization by TEM

Journal article published in 2012 by C. Leyva ORCID, A. Aguilar-Elguezabal, I. Reza
This paper was not found in any repository, but could be made available legally by the author.
This paper was not found in any repository, but could be made available legally by the author.

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Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.