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Cambridge University Press, Microscopy and Microanalysis, S2(18), p. 406-407, 2012

DOI: 10.1017/s1431927612003881

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The new aberration-corrected, cold-field emission JEOL JEM-ARM200CF STEM/TEM at the University of Illinois at Chicago

Journal article published in 2012 by R. F. Klie, A. Gulec ORCID, J. Liu, P. Phillips, R. Tao, K. Low, A. Nicholls
This paper was not found in any repository, but could be made available legally by the author.
This paper was not found in any repository, but could be made available legally by the author.

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Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.