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Cambridge University Press, Microscopy and Microanalysis, S2(18), p. 356-357, 2012

DOI: 10.1017/s1431927612003637

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Beyond the limits of imaging: advances and applications of model-based scanning transmission electron microscopy

Journal article published in 2012 by S. Van Aert ORCID, G. T. Martinez, A. De Backer, G. Van Tendeloo, A. Rosenauer
This paper was not found in any repository, but could be made available legally by the author.
This paper was not found in any repository, but could be made available legally by the author.

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Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.