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Cambridge University Press, Microscopy and Microanalysis, S2(16), p. 1798-1799, 2010

DOI: 10.1017/s1431927610060575

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The Importance of High-Resolution Scanning Transmission Electron Microscopy For Fine-Scale Dislocation Analysis

Journal article published in 2010 by Pj Phillips, L. Kovarik, Rr Unocic ORCID, D. Wei, D. Mourer, Mj Mills
This paper is made freely available by the publisher.
This paper is made freely available by the publisher.

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Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.