Published in

Cambridge University Press, Microscopy and Microanalysis, S2(14), p. 610-611, 2008

DOI: 10.1017/s1431927608087229

Links

Tools

Export citation

Search in Google Scholar

Non-Contact 3D Surface Metrology of Large Grain High Purity Niobium by SLCM and FESEM

Journal article published in 2008 by Zh Sung, Pj Lee ORCID, Dc Larbalestier ORCID
This paper was not found in any repository, but could be made available legally by the author.
This paper was not found in any repository, but could be made available legally by the author.

Full text: Unavailable

Green circle
Preprint: archiving allowed
Upload
Red circle
Postprint: archiving forbidden
Red circle
Published version: archiving forbidden
Policy details
Data provided by SHERPA/RoMEO

Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008