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Dissemin
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Sacedon et al., 2014
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@misc{Sacedon2014, author = {Sacedon, Ana and Merino, M. A. and Martin, V. and Inarrea, Jesus and Sanchez Vicente, Francisco J. and de la Hoz, Jesus and Ayucar, J. A. and Menendez-Moran, Isabel and Riloba, Alvaro and Mata, Carlos and Recio, Miguel}, doi = {10.13140/2.1.2816.9281}, month = {jan}, title = {Wafer Level Stress data succesfully used as early butn-in predictor}, url = {https://www.researchgate.net/profile/Jesus_Inarrea/publication/269692103_Wafer_Level_Stress_data_succesfully_used_as_early_butn-in_predictor/links/5491d9c20cf2991ff556063c.pdf}, year = {2014} }
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Wafer Level Stress data succesfully used as early butn-in predictor
Dataset published in 2014 by
Ana Sacedon
,
M. A. Merino
,
V. Martin
,
Jesus Inarrea
,
Francisco J. Sanchez Vicente
,
Jesus de la Hoz
,
J. A. Ayucar
,
Isabel Menendez-Moran
,
Alvaro Riloba
,
Carlos Mata
,
Miguel Recio
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