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Advanced Photonics 2013

DOI: 10.1364/iprsn.2013.iw5a.2

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High-Sensitivity In-Band OSNR Monitoring on a Silicon Photonics Platform

Proceedings article published in 2013 by Francesco Morichetti, Andrea Annoni, Rajat Sharma, Michael J. Strain, Marc Sorel, Andrea Melloni ORCID
This paper was not found in any repository; the policy of its publisher is unknown or unclear.
This paper was not found in any repository; the policy of its publisher is unknown or unclear.

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Abstract

We demonstrate high-sensitivity in-band OSNR monitoring on a SOI platform. The integrated system, including a ring resonator and an unbalanced Mach-Zehnder interferometer, enables OSNR measurements from 8 dB to 28 dB with 0.3 dB accuracy.