Time-of-flight Depth Imaging at 1550 nm Wavelength at Kilometer-range Distances Using an InGaAs/InP Single-Photon Avalanche Diode Detector
Proceedings article published in 2014 by
Ximing Ren,
Aongus McCarthy,
Adriano Della Frera,
Nathan R. Gemmell,
Nils J. Krichel,
Carmelo Scarcella,
Alessandro Ruggeri 
,
Alberto Tosi,
Gerald S. Buller
,
Alberto Tosi,
Gerald S. Buller
