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Institute of Electrical and Electronics Engineers, IEEE Transactions on Magnetics, 11(48), p. 2777-2780, 2012

DOI: 10.1109/tmag.2012.2203109

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Characterization of Organic Thin Films on Ferromagnetic Substrates by Spectroscopic Ellipsometry and Magneto-Optical Kerr Effect Spectroscopy

This paper was not found in any repository, but could be made available legally by the author.
This paper was not found in any repository, but could be made available legally by the author.

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