Published in
Institute of Electrical and Electronics Engineers, IEEE Transactions on Electron Devices, 1(59), p. 188-196, 2012
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Assessment of Self-Induced Joule-Heating Effect in the $I$–$V$ Readout Region of Polycrystalline $\hbox{Ge}_{2}\hbox{Sb}_{2}\hbox{Te}_{5}$ Phase-Change Memory
Journal article published in 2012 by
Giovanni Betti Beneventi,
Luca Perniola,
Quentin Hubert,
Alain Gliere,
Luca Larcher,
Paolo Pavan 
,
Barbara De Salvo
,
Barbara De Salvo
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