Published in
28th Symposium on Microelectronics Technology and Devices (SBMicro 2013)
DOI: 10.1109/sbmicro.2013.6676184
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Analysis of border traps in high-к gate dielectrics on high-mobility channels
Proceedings article published in 2013 by
E. Simoen,
H.-C. Lin,
A. Alian,
G. Brammertz 
,
C. Merckling,
J. Mitard,
C. Claeys
,
C. Merckling,
J. Mitard,
C. Claeys
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