Published in
2005 IEEE International Reliability Physics Symposium, 2005. Proceedings. 43rd Annual.
DOI: 10.1109/relphy.2005.1493197
Links
Tools
Effect of STI shape and tunneling oxide thinning on cell VTH variation in the flash memory
Proceedings article published in 2005 by
JaiDong Lee,
JungHwan Kim,
Woong Lee,
SangHoon Lee,
HunYoung Lim,
JaeDuk Lee,
SeokWoo Nam,
HyeonDeok Lee,
Chang L. Yong
This paper was not found in any repository, but could be made available legally by the author.
Full text: Unavailable
Published version:
archiving forbidden
Data provided by 