Published in
Institute of Electrical and Electronics Engineers, IEEE Journal of Solid-State Circuits, 9(43), p. 1940-1950, 2008
DOI: 10.1109/jssc.2008.2001912
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A 64 $\times$ 64-Pixel CMOS Test Chip for the Development of Large-Format Ultra-High-Speed Snapshot Imagers
Journal article published in 2008 by
Robert Berger,
Dennis D. Rathman,
Brian M. Tyrrell,
E. J. Kohler,
Michael K. Rose,
R. Allen Murphy,
Theodore S. Perry 
,
Harry F. Robey,
Franz A. Weber,
David M. Craig,
Antonio M. Soares,
Stephen P. Vernon,
Robert K. Reich
,
Harry F. Robey,
Franz A. Weber,
David M. Craig,
Antonio M. Soares,
Stephen P. Vernon,
Robert K. Reich
This paper was not found in any repository, but could be made available legally by the author.
Full text: Unavailable
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