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2012 4th IEEE International Memory Workshop
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Understanding of Trap-Assisted Tunneling Current - Assisted by Oxygen Vacancies in RuOx/SrTiO3/TiN MIM Capacitor for the DRAM Application
Proceedings article published in 2012 by
M.-S. Kim,
B. Kaczer,
S. Starschich,
M. Popovici,
J. Swerts,
O. Richard,
K. Tomida,
C. Vrancken,
S. Van Elshocht,
I. Debusschere,
L. Altimime,
J. A. Kittl 
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