Published in
Elsevier, Journal of Electroanalytical Chemistry, 1-2(379), p. 173-180
DOI: 10.1016/0022-0728(94)87136-1
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Characterisation of titanium passivation films by in situ ac impedance measurements and XPS analysis
Journal article published in 1994 by
Carlos da Fonseca,
Stephane Boudin,
Manuel da Cunha Belo,
Carlos Fonseca 
This paper was not found in any repository, but could be made available legally by the author.
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