Published in
IEEE International Geoscience and Remote Sensing Symposium
DOI: 10.1109/igarss.2002.1025877
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Global albedo, BRDF and nadir BRDF-adjusted reflectance products from MODIS
Proceedings article published in 2003 by
C. Schaaf 
,
Yufang Jin,
A. Strahler,
Feng Gao,
W. Lucht,
Y. Jin,
X. Li,
Xiaowen Li,
Xiaoyang Zhang,
E. Tsvetsinskaya,
J.-P. Muller,
P. Lewis,
M. Barnsley,
G. Roberts,
C. Doll
and other authors.
,
Yufang Jin,
A. Strahler,
Feng Gao,
W. Lucht,
Y. Jin,
X. Li,
Xiaowen Li,
Xiaoyang Zhang,
E. Tsvetsinskaya,
J.-P. Muller,
P. Lewis,
M. Barnsley,
G. Roberts,
C. Doll
and other authors.
This paper was not found in any repository, but could be made available legally by the author.
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