Published in
International Electron Devices Meeting 1998. Technical Digest (Cat. No.98CH36217)
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Point contact conduction at the oxide breakdown of MOS devices
Proceedings article published in 1970 by
Jordi Sune,
Enrique Miranda 
,
Montserrat Nafria,
Xavier Aymerich
,
Montserrat Nafria,
Xavier Aymerich
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