Published in
Proceedings of International Conference on Microelectronic Test Structures
DOI: 10.1109/icmts.1996.535627
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Analysis of charge storage in the base of bipolar transistors and its influence on the parasitic resistance adopting an eight terminal Kelvin test structure
Proceedings article published in 1970 by
Stefano Asti,
Tiziana Cavioni,
Andrea Neviani,
Paolo Pavan 
,
Massimo Stival,
Loris Vendrame,
Enrico Zanoni
,
Massimo Stival,
Loris Vendrame,
Enrico Zanoni
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