Published in
2006 International Conference on Advanced Semiconductor Devices and Microsystems
DOI: 10.1109/asdam.2006.331143
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Reliability issues in advanced High k/metal gate stacks for 45 nm CMOS applications
Proceedings article published in 2006 by
G. Groeseneken,
M. Aoulaiche,
S. De Gendt,
R. Degraeve,
M. Houssa 
,
T. Kauerauf,
L. Pantisano
,
T. Kauerauf,
L. Pantisano
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