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American Institute of Physics, Applied Physics Letters, 14(103), p. 142106

DOI: 10.1063/1.4824077

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Growth and properties of GaSbBi alloys

Journal article published in 2013 by Mk K. Rajpalke, Wm M. Linhart, M. Birkett ORCID, Km M. Yu ORCID, Do O. Scanlon ORCID, J. Buckeridge ORCID, Ts S. Jones, Mj J. Ashwin, Td D. Veal
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This paper is available in a repository.

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Abstract

Molecular-beam epitaxy has been used to grow GaSb1-xBix alloys with x up to 0.05. The Bi content, lattice expansion, and film thickness were determined by Rutherford backscattering and x-ray diffraction, which also indicate high crystallinity and that >98% of the Bi atoms are substitutional. The observed Bi-induced lattice dilation is consistent with density functional theory calculations. Optical absorption measurements and valence band anticrossing modeling indicate that the room temperature band gap varies from 720 meV for GaSb to 540 meV for GaSb0.95Bi0.05, corresponding to a reduction of 36 meV/%Bi or 210 meV per 0.01 Å change in lattice constant.