Published in
Institute of Electrical and Electronics Engineers, IEEE Transactions on Electron Devices, 6(62), p. 2007-2013, 2015
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Analysis of the Excellent Memory Disturb Characteristics of a Hourglass-Shaped Filament in Al<sub>2</sub>O<sub>3</sub>/Cu-Based CBRAM Devices
Journal article published in 2015 by
Attilio Belmonte,
Umberto Celano,
Augusto Redolfi,
Andrea Fantini,
Robert Muller,
Wilfried Vandervorst,
Michel Houssa 
,
Malgorzata Jurczak,
Ludovic Goux
,
Malgorzata Jurczak,
Ludovic Goux
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