Published in
Institute of Electrical and Electronics Engineers, IEEE Transactions on Electron Devices, 1(45), p. 116-124, 1998
DOI: 10.1109/16.658821
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Positive bias temperature instability in MOSFETs
Journal article published in 1998 by
Jf F. Zhang 
,
W. Eccleston
,
W. Eccleston
This paper was not found in any repository, but could be made available legally by the author.
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