Published in
Cambridge University Press, Microscopy and Microanalysis, S3(21), p. 2197-2198, 2015
DOI: 10.1017/s1431927615011769
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Towards Statistically Representative Atomic Resolution 3D Nano-metrology for Materials Modelling and Catalyst Design
Journal article published in 2015 by
Lewys Jones 
,
Katherine E. MacArthur,
Jolyon Aarons,
Chris-Kriton Skylaris,
Misbah Sarwar,
Dogan Ozkaya,
Peter D. Nellist
,
Katherine E. MacArthur,
Jolyon Aarons,
Chris-Kriton Skylaris,
Misbah Sarwar,
Dogan Ozkaya,
Peter D. Nellist
This paper is made freely available by the publisher.
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