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Elsevier, Ultramicroscopy, 8(108), p. 727-736

DOI: 10.1016/j.ultramic.2007.11.004

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A phenomenological model of fluctuation electron microscopy for a nanocrystal/amorphous composite

Journal article published in 2008 by W. G. Stratton, P. M. Voyles ORCID
This paper was not found in any repository, but could be made available legally by the author.
This paper was not found in any repository, but could be made available legally by the author.

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