Published in
Elsevier, Microelectronic Engineering, 7-9(86), p. 1747-1750
DOI: 10.1016/j.mee.2009.03.110
Links
Tools
A first-principles study of the structural and electronic properties of III–V/thermal oxide interfaces
Journal article published in 2009 by
M. Scarrozza,
G. Pourtois,
M. Houssa 
,
M. Caymax,
A. Stesmans,
M. Meuris,
M. M. Heyns
,
M. Caymax,
A. Stesmans,
M. Meuris,
M. M. Heyns
This paper was not found in any repository, but could be made available legally by the author.
Full text: Unavailable
Postprint:
archiving forbidden
Published version:
archiving forbidden
Data provided by 