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Elsevier, Materials Chemistry and Physics: Including Materials Science Communications, 2-3(81), p. 273-276

DOI: 10.1016/s0254-0584(02)00600-4

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Contribution to quantitative measurement of the In composition in GaN/InGaN multilayers

Journal article published in 2003 by S. Kret, G. Maciejewski, P. Dluzewski, P. Ruterana, N. Grandjean, B. Damilano ORCID
This paper was not found in any repository, but could be made available legally by the author.
This paper was not found in any repository, but could be made available legally by the author.

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