Published in
Elsevier, Microelectronic Engineering, 1-4(36), p. 227-230
DOI: 10.1016/s0167-9317(97)00054-3
Links
Tools
Generation and annealing of hot hole induced interface states
This paper was not found in any repository, but could be made available legally by the author.
Full text: Unavailable
Postprint:
archiving forbidden
Published version:
archiving forbidden
Data provided by 