Published in
Wiley, physica status solidi (b) – basic solid state physics, 4(248), p. 941-949, 2010
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Characterization of point defects in ZnO thin films by optical deep level transient spectroscopy
Journal article published in 2010 by
Martin Ellguth,
Matthias Schmidt,
Rainer Pickenhain,
Holger V. Wenckstern,
Marius Grundmann 
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