Published in
Wiley, physica status solidi (a) – applications and materials science, 3(208), p. 588-591
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Structural characterization of crystallized Si thin film material by HRTEM and Raman spectroscopy
Journal article published in 2010 by
Teimuraz Mchedlidze 
,
Maryam Beigmohamadi,
Birger Berghoff,
Rakesh Sohal,
Stephan Suckow,
Tzanimir Arguirov,
Noël Wilck,
Joachim Mayer,
Bernd Spangenberg,
Martin Kittler
,
Maryam Beigmohamadi,
Birger Berghoff,
Rakesh Sohal,
Stephan Suckow,
Tzanimir Arguirov,
Noël Wilck,
Joachim Mayer,
Bernd Spangenberg,
Martin Kittler
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