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Elsevier, Journal of Nuclear Materials, (271-272), p. 285-289

DOI: 10.1016/s0022-3115(98)00715-6

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TEM analyses of surface ridge network in an ion-irradiated graphite thin film

Journal article published in 1999 by S. Muto ORCID, T. Tanabe, M. Takeuchi, Y. Kobayashi, S. Furuno, K. Hojou
This paper was not found in any repository, but could be made available legally by the author.
This paper was not found in any repository, but could be made available legally by the author.

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