Published in
Elsevier, Applied Surface Science, (231-232), p. 813-816
DOI: 10.1016/j.apsusc.2004.03.124
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Characterization of silicon nanocrystals embedded in thin oxide layers by TOF-SIMS
Journal article published in 2004 by
M. Perego,
S. Ferrari,
M. Fanciulli,
G. Ben Assayag,
C. Bonafos,
M. Carrada,
A. Claverie
This paper was not found in any repository, but could be made available legally by the author.
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